ZEISS ULTRA 55 Field-Emission Scanning Electron Microscope

Laboratory

ZEISS ULTRA 55 Field-Emission Scanning Electron Microscope

Manufacturer: ZEISS (Germany)8ZEISS场发射扫描电镜-小.jpg

Equipment model: ULTRA 55

Location: Room 110 of Science and Technology Building

Person-in-charge: Li Xiao

Tel.: 62332598-6110


Main functions:

Can be used to observe and detect surface appearance characteristics and composition, and conduct specimen test analysis at micron and nanometer levels. Its most important feature is its ultra-high resolution scanning image observation capability, especially the use of the latest digital image processing technology, to provide high magnification and high resolution scanning images. It is the most effective instrument for particle size measurement and morphology observation of nanomaterials, and is also an indispensable tool to study the relationship between material structure and performance. It is widely used in biology, medicine, metal materials, polymer materials, chemical raw materials, geological minerals, commodity inspection, production quality control, gem identification, archaeology and antique authentication, as well as physical evidence analysis in forensic criminal investigation.


Main technical parameters:

Resolution: 1.0 nm @ 15 kV

Magnification: 12 × ~ 900,000 × (SE)

Acceleration voltage: 0.1 kV ~ 30 kV

Probe current: 4 pA ~ 20 nA

Specimen room: 330 mm (inside diameter) × 270 mm (height)

Specimen stage: stroke: X = Y = 130 mm; Z = 50 mm

Rotation: 360° continuous (motor driven)

Tilt: -3° to +70° (motor driven)


Configuration:

1. Detector:

In-lens secondary electron detector

E-T secondary electron detector

Electron gun built-in energy selective backscattered (EsB) electron detector

Angle selective backscattered (AsB) electron detector

2. X-ray energy dispersive spectrometer (EDS)

Model: INCA X-MAX 50 (Oxford Instruments)

Energy resolution: 129 eV@MnKα

Detection element range: Be4-U92

3. Electron back scattering diffraction (EBSD) analysis system

Model: HKL NORDLYS F+ (Oxford Instruments)

Spatial resolution: more than 50 nm

Calibration speed: 600 Hz (point/second)

4. In-situ stretching table

Model: Mtest 2000 ES (Gatan)

Max. load: 2,000 kN;

Force test accuracy: 1% of load level

Stretching speed: 0.033-0.4 mm/min.

Stretchable distance of test piece: ≤ 10 mm


Laboratory appointment:

http://202.204.49.249/Equipment/Show?Id="647c4637-a306-4fc0-8ffc-fd1558e7afa5