Manufacturer: OLYMPUS (Japan)

Equipment Model: LEXT OLS4100

Location: Room 204 of Science and Technology Building

Person-in-charge: Wang Lili

Tel.: 62332598-6206

Main functions:

The LEXT OLS4100 laser scanning confocal microscope is equipped with a 405-nm short-wavelength laser and a high numerical aperture objective lens to observe and measure the three-dimensional morphology of the specimen surface in a non-contact manner. It adopts a dual confocal system, combined with high-sensitivity detectors, so that specimens with different reflectivity can also be processed to obtain vivid images. Its planar resolution can reach 12 μm, and height difference resolution is up to 10 nm, and can be used to perform submicron measurements on the surface of the specimen. Furthermore, it can conveniently and quickly obtain images and is equipped with abundant measurement functions.

Main technical parameters:

Light source: 405 nm, semiconductor laser

Detection system: photomultiplier

Plane resolution: 0.12 μm; repeatability: 0.02 μm

Correctness: within ±2% of the measured value

High resolution: 10 nm; repeatability: 0.012 μm;

Correctness: 0.2+L/100 μm or less (L = measuring length: μm)

Objective lens: bright field plane semi-achromatic lens 5×, 10× LEXT special plane apochromatic lens 20×, 50× and 100×

Z: focus section stroke: 100 mm

XY motor stage: 100 × 100 mm

Main applications:

1. Obtain 2D and 3D images of the specimen surface.

2. Measure the difference between any two points on the profile section; profile measurement is also available.

3. Measure the line and surface roughness of the whole plane.

4. Adopt splicing function to obtain a full image of the specimen.

5. Area/volume measurement: The volume of the upper or lower part can be measured according to any threshold set on the profile section.

6. One-click report generation.

Laboratory appointment:

http://202.204.49.249/Equipment/Show?Id=31767eea-8462-486c-a268-10642407d0a3